Thermal ageing analysis and lifetime prediction of igbt inverter for solar pv-grid electricity connectivity
Article, Ajoutée
le 17/02/2017 20:27
Thermal factors contributing to the ageing of Insulated Gate Bipolar Transistor (IGBT) inverters were investigat-ed, with special reference to temperature variation as the main source of degradation of the electrical insulations and material layers. [...]
HOUNGAN KOKOU THÉOPHILE [2], FIFATIN FRANÇOIS-XAVIER NICOLAS [3], SALEH MAHAMAT [4], ESPANET CHRISTOPHE [5], AGBOKPANZO RICHARD GILLES [1],